Chapter Contents |
Previous |
Next |
Details and Examples |
See PARETO9 in the SAS/QC Sample Library |
During the manufacture of a MOS capacitor, different cleaning processes were used by two manufacturing systems operating in parallel. Process A used a standard cleaning solution, while Process B used a different cleaning mixture that contained less particulate matter. The failure causes observed with each process for five consecutive days were recorded and saved in a SAS data set called FAILURE4.
data failure4; label cause = 'Cause of Failure' ; input process $ 1-9 day $ 13-19 cause $ 23-36 counts 40-41; datalines; Process A March 1 Contamination 15 Process A March 1 Corrosion 2 Process A March 1 Doping 1 Process A March 1 Metallization 2 Process A March 1 Miscellaneous 3 Process A March 1 Oxide Defect 8 Process A March 1 Silicon Defect 1 Process A March 2 Contamination 16 Process A March 2 Corrosion 3 Process A March 2 Doping 1 Process A March 2 Metallization 3 Process A March 2 Miscellaneous 1 Process A March 2 Oxide Defect 9 Process A March 2 Silicon Defect 2 Process A March 3 Contamination 20 Process A March 3 Corrosion 1 Process A March 3 Doping 1 Process A March 3 Metallization 0 Process A March 3 Miscellaneous 3 Process A March 3 Oxide Defect 7 Process A March 3 Silicon Defect 2 Process A March 4 Contamination 12 Process A March 4 Corrosion 1 Process A March 4 Doping 1 Process A March 4 Metallization 0 Process A March 4 Miscellaneous 0 Process A March 4 Oxide Defect 10 Process A March 4 Silicon Defect 1 Process A March 5 Contamination 23 Process A March 5 Corrosion 1 Process A March 5 Doping 1 Process A March 5 Metallization 0 Process A March 5 Miscellaneous 1 Process A March 5 Oxide Defect 8 Process A March 5 Silicon Defect 2 Process B March 1 Contamination 8 Process B March 1 Corrosion 2 Process B March 1 Doping 1 Process B March 1 Metallization 4 Process B March 1 Miscellaneous 2 Process B March 1 Oxide Defect 10 Process B March 1 Silicon Defect 3 Process B March 2 Contamination 9 Process B March 2 Corrosion 0 Process B March 2 Doping 1 Process B March 2 Metallization 2 Process B March 2 Miscellaneous 4 Process B March 2 Oxide Defect 9 Process B March 2 Silicon Defect 2 Process B March 3 Contamination 4 Process B March 3 Corrosion 1 Process B March 3 Doping 1 Process B March 3 Metallization 0 Process B March 3 Miscellaneous 0 Process B March 3 Oxide Defect 10 Process B March 3 Silicon Defect 1 Process B March 4 Contamination 2 Process B March 4 Corrosion 2 Process B March 4 Doping 1 Process B March 4 Metallization 0 Process B March 4 Miscellaneous 3 Process B March 4 Oxide Defect 7 Process B March 4 Silicon Defect 1 Process B March 5 Contamination 1 Process B March 5 Corrosion 3 Process B March 5 Doping 1 Process B March 5 Metallization 0 Process B March 5 Miscellaneous 1 Process B March 5 Oxide Defect 8 Process B March 5 Silicon Defect 2 ;In addition to the process variable CAUSE, there are two classification variables in this data set: PROCESS and DAY. The variable COUNTS is a frequency variable.
This example creates a series of displays that progressively use more of the classification information.
title 'Pareto Analysis of Capacitor Failures' ; proc pareto data=failure4; vbar cause / freq = counts last = 'Miscellaneous' scale = count anchor = bl cframe = ligr cbars = vigb cconnect = salmon nlegend ; run;
The chart, shown in Output 29.2.1, indicates that contamination is the most frequently occurring problem.
Output 29.2.1: Pareto Analysis without Classification VariablesThe option ANCHOR=BL anchors the cumulative percent curve at the bottom left (BL) of the first bar. The NLEGEND option adds a sample size legend.
title 'Pareto Analysis by Cleaning Process' ; proc pareto data=failure4; vbar cause / class = process freq = counts last = 'Miscellaneous' scale = count catleglabel = 'Failure Causes:' intertile = 1.0 cframe = ligr cbars = vigb cframeside = ligr nohlabel nocurve nlegend ; run;Output 29.2.2: One-Way Comparative Pareto Analysis with CLASS=PROCESS
The CATLEGLABEL= option specifies the category legend label Failure Causes:. The NOHLABEL option suppresses the horizontal axis labels. The NOCURVE option suppresses the cumulative percent curve.
The following statements specify DAY as a classification variable:
title 'Pareto Analysis by Day'; proc pareto data=failure4; vbar cause / class = day freq = counts last = 'Miscellaneous' scale = count cbars = vigb cframe = ligr cframetop = ligr catleglabel = 'Failure Causes:' intertile = 1.0 nrows = 1 ncols = 5 vref = 5 10 15 20 lvref = 34 nohlabel nocurve nlegend ; run;
The NROWS= and NCOLS= options display the cells in a side-by-side arrangement. The VREF= and LVREF= options add reference lines. The chart is displayed in Output 29.2.3.
Output 29.2.3: One-Way Comparative Pareto Analysis with CLASS=DAY
title 'Pareto Analysis by Process and Day' ; proc pareto data=failure4; vbar cause / class = ( process day ) freq = counts nrows = 2 ncols = 5 cbars = vigb cframe = ligr cframetop = ligr cframeside = ligr last = 'Miscellaneous' scale = count catleglabel = 'Failure Causes:' intertile = 1.0 nohlabel nocurve nlegend ; run;
The chart is displayed in Output 29.2.4.
Output 29.2.4: Two-Way Comparative Pareto Analysis for PROCESS and DAY
Chapter Contents |
Previous |
Next |
Top |
Copyright © 1999 by SAS Institute Inc., Cary, NC, USA. All rights reserved.