Supervisor: Carlo Menon

Description:

The Atomic Force Microscope (AFM) is based on a cantilever that deforms when in contact with the surface to be imaged. Its resolution is on the order of fraction of a nanometer! This is one of the most advanced technological devices used in engineering.

For more info: http://en.wikipedia.org/wiki/Atomic_force_microscopy

During this coop term, the student, assisted by a PhD student, should:

(1)  Acquire basic knowledge of an AFM

(2)  Program the AFM such that it can measure nano-forces

(3)  Perform tests with nano-objects

Knowledge required: ENSC383 or equivalent.

Prerequisite:  1) at least 100 credit hours; and 2) CGPA>2.8.

Notes: 1) Minimum honorarium is provided; 2) The ideal candidate would like to contribute in applied research and be willing to work with hardware.