Publications (Archive)
Published Papers
Effects of sulfur isotopic
composition on the band gap of PbS
Lian HJ., Yang A., Thewalt M. L. W., et al., Phys. Rev. B 73, 233202 (2006)
Isotopic mass dependence of
the lattice parameter in silicon determined by measurement of strain-induced splitting of impurity bound
exciton transitions
Yang A., Lian H. J., Thewalt M. L. W. et al., Physica B-Condensed Matter 376, 54-56 (2006)
Local vibrational mode study of
carbon-doped InAs
S. Najmi, X. K. Chen, A. Yang, M. Steger, M. L. W. Thewalt, and S. P. Watkins, Phys. Rev. B 74, 113202
(2006)
Isotope Effects on the Optical
Spectra of Semiconductors
M. Cardona and M. L. W. Thewalt, Reviews of Modern Physics 77, 1173-1224 (2005).
Spectroscopy of Excitons and
Shallow Impurities in Isotopically Enriched Silicon - Electronic Properties beyond the Virtual Crystal
Approximation
M. L. W. Thewalt, Solid State Commun. 133, 715-725 (2005).
Temperature Dependence of the
Energy Gap of Semiconductors in the Low Temperature Limit
M. Cardona, T. A. Meyer and M. L. W. Thewalt, Phys. Rev. Lett. 92, 196403-1 to 4 (2004).
Sulfur Isotope Effects on the
Excitonic Spectra of CdS
T. A. Meyer, M. L. W. Thewalt, M. Cardona and R. Lauck, Phys. Rev. B 69, 115214-1 to 5 (2004).
Impurity Absorption
Spectroscopy in 28Si: the Importance of Inhomogeneous Isotope Broadening
D. Karaiskaj, J. A. H. Stotz, T. Meyer, M. L. W. Thewalt and M. Cardona, Phys. Rev. Lett. 90, 186402-1 to 4
(2003).
Origin of the Residual Acceptor
Ground State Splitting in Silicon
D. Karaiskaj, G. Kirczenow, M. L. W. Thewalt, R. Buczko and M. Cardona, Phys. Rev. Lett. 90, 016404-1 to 4
(2003).
Dependence of the Ionization
Energy of Shallow Donors and Acceptors in Silicon on the Host Isotopic Mass
D. Karaiskaj, T. A. Meyer, M. L. W. Thewalt and M. Cardona, Phys. Rev. B 68, 121201-1 to 4 (2003).
Acceptor Identification Using
Magnetophotoluminescence of Bound Excitons States in InSb
J. A. H. Stotz and M. L. W. Thewalt, Phys. Rev. B 67, 155210-1 to 14 (2003).
`Intrinsic' Acceptor Ground
State Splitting in Si: an Isotopic Effect
D. Karaiskaj, M. L. W. Thewalt, T. Ruf, M. Cardona and M. Konuma, Phys. Rev. Lett. 89, 016401-1 to 4
(2002).
Photoluminescence of
Isotopically Purified Silicon: How Sharp are Bound Exciton Transitions?
D. Karaiskaj, M. L. W. Thewalt T. Ruf, M. Cardona, H.-J. Pohl, G. G. Devyatych, P. G. Sennikov and H.
Riemann, Phys. Rev. Lett. 86, 6010-6013 (2001).
Magnetophotoluminescence
of D- singlet and triplet states in GaAs
D. A. Harrison, J. A. H. Stotz, V. A. Karasyuk, S. P. Watkins and M. L. W. Thewalt, Phys. Rev. B 60,
15,527-15,530 (1999).
A New Photoluminescence
Transition in GaAs Involving D- States
D. A. Harrison, S. P. Watkins, M. L. W. Thewalt, D. J. S. Beckett and A. J. SpringThorpe, Phys. Rev. Lett.
80, 2461-2464 (1998).
Type II Photoluminescence and Conduction Band Offsets of GaAsSb/InP and GaAsSb/InGaAs/InP
Heterostructures Grown by Metalorganic Vapor Phase Epitaxy
J. Hu, X. Xu, J. A. Stotz, S. P. Watkins, M. L. W. Thewalt and C. R. Bolognesi, Appl. Phys. Lett. 73,
2799-2801 (1998).
High Resolution Spectroscopy of Free Standing GaAs Films Prepared by Epitaxial
Lift-Off
D. A. Harrison, J. Hu, S. P. Watkins, A. E. Curzon, M. L. W. Thewalt, D. J. S. Beckett and A. J.
SpringThorpe, J. Appl. Phys. 84, 5772-5775 (1998).
Lattice Parameter Variation in Doped GaAs Substrates Determined Using High Resolution
Photoluminescence Spectroscopy
J. Hu, D. A. Harrison, V. A. Karasyuk, S. P. Watkins, M. L. W. Thewalt, I. Bassignana, D. J. S. Beckett, G.
C. Hiller and A. J. SpringThorpe, J. Appl. Phys. 84, 6305-6311 (1998).
Double
Heterojunction Bipolar Transistors with Balistically Launched Collector Electrons
N. Matine, M. W. Dvorak, C. R. Bolognesi, X. Xu, J. Hu, S. P. Watkins and M. L. W. Thewalt, Electronics
Lett. 34, 1700-1702 (1998).
Strain Effects on bound exciton luminescence in epitaxial GaAs studied using a wafer bending
technique
V. A. Karasyuk, M. L. W. Thewalt and A. J. SpringThorpe, Phys. Stat. Sol. B 210, 353-359 (1998).
Type II Band Alignment in
Si1-xGex/Si(001) Quantum Wells: the Ubiquitous Type I Luminescence Results from Band Bending
M. L. W. Thewalt, D. A. Harrison, C. F. Reinhart and J. A. Wolk, Phys. Rev. Lett. 79, 269-272 (1997).
Characterization of
Interfacial Dopant Layer for High Purity InP Grown by Metalorganic Chemical Vapour
Deposition
D. G. Knight, G. Kelly, J. Hu, S. P. Watkins and M. L. W. Thewalt, J. Cryst. Growth 182, 23-29 (1997).
Fourier-Transform
Photoluminescence Spectroscopy of Excitons Bound to Group-III Acceptors in Silicon: Uniaxial
Stress
V. A. Karasyuk, M. L. W. Thewalt, S. An and E. C. Lightowlers, Phys. Rev. B 56, 15672-15684 (1997).
Large Photoluminescence Enhancements from Epitaxial GaAs Passivated by Postgrowth
Phosphidization
D. A. Harrison, R. Ares, S. P. Watkins, M. L. W. Thewalt, C. R. Bolognesi, D. J. S. Beckett and A. J.
SpringThorpe, Appl. Phys. Lett. 70, 3275-3277 (1997).
Central cell effects in the shallow acceptor spectra of Si and Ge
N. O. Lipari, M. L. W. Thewalt, W. Andreoni, A. Baldereschi, J. Phys. Soc. Japan 49 Suppl. A, 165-168 (1980).
Presented Posters
Gordon Research Conference on Defects in Semiconductors 2010, New London, NH:
Highly Enriched 28Si - the Perfect Semiconductor
ICDS-24 (2007), Albuquerque, NM:
ICPS-28 (2006), Vienna, Austria: